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Stochastic analysis of CNFET circuits using enhanced logical effort model in the presence of metallic tubes

Muhammad Ali, Mohammad A. Ahmed, Malgorzata Chrzanowska-Jeske. Stochastic analysis of CNFET circuits using enhanced logical effort model in the presence of metallic tubes. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 774-777, IEEE, 2014. [doi]

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