Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri. New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure. In Alex Orailoglu, H. Fatih Ugurdag, Luis Miguel Silveira, Martin Margala, Ricardo Reis, editors, VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and Extended Selected Papers. Volume 461 of IFIP Advances in Information and Communication Technology, pages 48-68, Springer, 2013. [doi]
@inproceedings{AliSSK13a,
title = {New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure},
author = {Sk Subidh Ali and Samah Mohamed Saeed and Ozgur Sinanoglu and Ramesh Karri},
year = {2013},
doi = {10.1007/978-3-319-23799-2_3},
url = {http://dx.doi.org/10.1007/978-3-319-23799-2_3},
researchr = {https://researchr.org/publication/AliSSK13a},
cites = {0},
citedby = {0},
pages = {48-68},
booktitle = {VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and Extended Selected Papers},
editor = {Alex Orailoglu and H. Fatih Ugurdag and Luis Miguel Silveira and Martin Margala and Ricardo Reis},
volume = {461},
series = {IFIP Advances in Information and Communication Technology},
publisher = {Springer},
isbn = {978-3-319-23798-5},
}