Cesare Alippi, Marcantonio Catelani, Ada Fort, Marco Mugnaini. Automated selection of test frequencies for fault diagnosis in analog electronic circuits. IEEE T. Instrumentation and Measurement, 54(3):1033-1044, 2005. [doi]
@article{AlippiCFM05,
title = {Automated selection of test frequencies for fault diagnosis in analog electronic circuits},
author = {Cesare Alippi and Marcantonio Catelani and Ada Fort and Marco Mugnaini},
year = {2005},
doi = {10.1109/TIM.2005.847115},
url = {http://dx.doi.org/10.1109/TIM.2005.847115},
tags = {testing},
researchr = {https://researchr.org/publication/AlippiCFM05},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {3},
pages = {1033-1044},
}