Low-power test in compression-based reconfigurable scan architectures - researchr publication authors

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Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah. Low-power test in compression-based reconfigurable scan architectures. In João Antonio Martino, Guido Araujo, Alex Orailoglu, Felipe Klein, editors, Proceedings of the 23rd Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2010, São Paulo, Brazil, September 6-9, 2010. pages 55-60, ACM, 2010. [doi]

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