Test power reduction in compression-based reconfigurable scan architectures

Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah. Test power reduction in compression-based reconfigurable scan architectures. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 249, IEEE Computer Society, 2010. [doi]

Authors

Sobeeh Almukhaizim

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Mohammad Gh. Mohammad

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Mohammad Khajah

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