A characterization of easily testable induced subgraphs

Noga Alon, Asaf Shapira. A characterization of easily testable induced subgraphs. In J. Ian Munro, editor, Proceedings of the Fifteenth Annual ACM-SIAM Symposium on Discrete Algorithms, SODA 2004, New Orleans, Louisiana, USA, January 11-14, 2004. pages 942-951, SIAM, 2004. [doi]

@inproceedings{AlonS04:1,
  title = {A characterization of easily testable induced subgraphs},
  author = {Noga Alon and Asaf Shapira},
  year = {2004},
  doi = {10.1145/982792.982934},
  url = {http://doi.acm.org/10.1145/982792.982934},
  tags = {testing},
  researchr = {https://researchr.org/publication/AlonS04%3A1},
  cites = {0},
  citedby = {0},
  pages = {942-951},
  booktitle = {Proceedings of the Fifteenth Annual ACM-SIAM Symposium on Discrete Algorithms, SODA 2004, New Orleans, Louisiana, USA, January 11-14, 2004},
  editor = {J. Ian Munro},
  publisher = {SIAM},
}