J2EE instrumentation for software aging root cause application component determination with AspectJ

Javier Alonso, Jordi Torres, Josep Lluis Berral, Ricard Gavaldà. J2EE instrumentation for software aging root cause application component determination with AspectJ. In 24th IEEE International Symposium on Parallel and Distributed Processing, IPDPS 2010, Atlanta, Georgia, USA, 19-23 April 2010 - Workshop Proceedings. pages 1-8, IEEE, 2010. [doi]

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