Andreas Altes, Rainer Tilgner, Markus Reissner, Grazyna Steckert, Gerald Neumann. Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations. Microelectronics Reliability, 48(8-9):1273-1278, 2008. [doi]
@article{AltesTRSN08,
title = {Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations},
author = {Andreas Altes and Rainer Tilgner and Markus Reissner and Grazyna Steckert and Gerald Neumann},
year = {2008},
doi = {10.1016/j.microrel.2008.06.020},
url = {http://dx.doi.org/10.1016/j.microrel.2008.06.020},
researchr = {https://researchr.org/publication/AltesTRSN08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1273-1278},
}