Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements

Josep Altet, D. Mateo, J. L. González, E. Aldrete-Vidrio. Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. In International Symposium on Circuits and Systems (ISCAS 2006), 21-24 May 2006, Island of Kos, Greece. IEEE, 2006. [doi]

Authors

Josep Altet

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D. Mateo

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J. L. González

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E. Aldrete-Vidrio

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