Permanent Magnet Synchronous Machines Inter- Turn Short Circuit Fault Detection by Means of Model-Based Residual Analysis

Fernando Alvarez-Gonzalez, Antonio Griffo, Bo Wang 0021. Permanent Magnet Synchronous Machines Inter- Turn Short Circuit Fault Detection by Means of Model-Based Residual Analysis. In IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018. pages 647-652, IEEE, 2018. [doi]

@inproceedings{Alvarez-Gonzalez18,
  title = {Permanent Magnet Synchronous Machines Inter- Turn Short Circuit Fault Detection by Means of Model-Based Residual Analysis},
  author = {Fernando Alvarez-Gonzalez and Antonio Griffo and Bo Wang 0021},
  year = {2018},
  doi = {10.1109/IECON.2018.8591661},
  url = {https://doi.org/10.1109/IECON.2018.8591661},
  researchr = {https://researchr.org/publication/Alvarez-Gonzalez18},
  cites = {0},
  citedby = {0},
  pages = {647-652},
  booktitle = {IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, Washington, DC, USA, October 21-23, 2018},
  publisher = {IEEE},
  isbn = {978-1-5090-6684-1},
}