Alexandre M. Amory, Edson I. Moreno, Fernando Moraes, Marcelo Lubaszewski. Determining the test sources/sinks for NoC TAMs. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013. pages 8-13, IEEE, 2013. [doi]
@inproceedings{AmoryMML13,
title = {Determining the test sources/sinks for NoC TAMs},
author = {Alexandre M. Amory and Edson I. Moreno and Fernando Moraes and Marcelo Lubaszewski},
year = {2013},
doi = {10.1109/ISVLSI.2013.6654615},
url = {http://dx.doi.org/10.1109/ISVLSI.2013.6654615},
researchr = {https://researchr.org/publication/AmoryMML13},
cites = {0},
citedby = {0},
pages = {8-13},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2013, Natal, Brazil, August 5-7, 2013},
publisher = {IEEE},
}