M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma. A novel diagnostic test generation methodology and its application in production failure isolation. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{AmyeenKCNVJGS16,
title = {A novel diagnostic test generation methodology and its application in production failure isolation},
author = {M. Enamul Amyeen and Dongok Kim and Maheshwar Chandrasekar and Mohammad Noman and Srikanth Venkataraman and Anurag Jain and Neha Goel and Ramesh Sharma},
year = {2016},
doi = {10.1109/TEST.2016.7805821},
url = {http://dx.doi.org/10.1109/TEST.2016.7805821},
researchr = {https://researchr.org/publication/AmyeenKCNVJGS16},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}