Gabin An, Jinhan Kim, Shin Yoo. Comparing line and AST granularity level for program repair using PyGGI. In Justyna Petke, Kathryn T. Stolee, William B. Langdon, Westley Weimer, editors, Proceedings of the 4th International Genetic Improvement Workshop, GI@ICSE 2018, Gothenburg, Sweden, June 2, 2018. pages 19-26, ACM, 2018. [doi]
@inproceedings{AnKY18,
title = {Comparing line and AST granularity level for program repair using PyGGI},
author = {Gabin An and Jinhan Kim and Shin Yoo},
year = {2018},
doi = {10.1145/3194810.3194814},
url = {https://doi.org/10.1145/3194810.3194814},
researchr = {https://researchr.org/publication/AnKY18},
cites = {0},
citedby = {0},
pages = {19-26},
booktitle = {Proceedings of the 4th International Genetic Improvement Workshop, GI@ICSE 2018, Gothenburg, Sweden, June 2, 2018},
editor = {Justyna Petke and Kathryn T. Stolee and William B. Langdon and Westley Weimer},
publisher = {ACM},
}