Ting An, Kaikai Liu, Hao Cai, Lirida A. B. Naviner. Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method. Microelectronics Reliability, 55(3-4):696-703, 2015. [doi]
@article{AnLCN15, title = {Accurate reliability analysis of concurrent checking circuits employing an efficient analytical method}, author = {Ting An and Kaikai Liu and Hao Cai and Lirida A. B. Naviner}, year = {2015}, doi = {10.1016/j.microrel.2014.12.018}, url = {http://dx.doi.org/10.1016/j.microrel.2014.12.018}, researchr = {https://researchr.org/publication/AnLCN15}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {55}, number = {3-4}, pages = {696-703}, }