Defectnet: Multi-Class Fault Detection on Highly-Imbalanced Datasets

Nantheera Anantrasirichai, David R. Bull. Defectnet: Multi-Class Fault Detection on Highly-Imbalanced Datasets. In 2019 IEEE International Conference on Image Processing, ICIP 2019, Taipei, Taiwan, September 22-25, 2019. pages 2481-2485, IEEE, 2019. [doi]

Authors

Nantheera Anantrasirichai

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David R. Bull

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