Runtime-Coordinated Scalable Incremental Checksum Testing of Combinational Circuits - researchr publication authors

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Stefan Andrei, Wei-Ngan Chin, Albert Mo Kim Cheng, Yongxin Zhu. Runtime-Coordinated Scalable Incremental Checksum Testing of Combinational Circuits. In 11th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2005), 17-19 August 2005, Hong Kong, China. pages 357-360, IEEE Computer Society, 2005. [doi]

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