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Pitfalls in the Fractal Characterization of Real Microscopic Surfaces by Frequency

Eloy Anguiano, Manuel Pancorbo, Miguel Aguilar. Pitfalls in the Fractal Characterization of Real Microscopic Surfaces by Frequency. In Miroslav M. Novak, editor, Fractals in the Natural and Applied Sciences, Proceedings of the Second IFIP Working Conference on Fractals in the Natural and Applied Sciences, London, U.K., 7-10 September, 1993. Volume A-41 of IFIP Transactions, pages 37-46, North-Holland, 1993.

Authors

Eloy Anguiano

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Manuel Pancorbo

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Miguel Aguilar

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