Jin-Ping Ao, Yuya Yamaoka, Masaya Okada, Cheng-Yu Hu, Yasuo Ohno. Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress. IEICE Transactions, 91-C(7):1004-1008, 2008. [doi]
@article{AoYOHO08,
title = {Investigation on Current Collapse of AlGaN/GaN HFET by Gate Bias Stress},
author = {Jin-Ping Ao and Yuya Yamaoka and Masaya Okada and Cheng-Yu Hu and Yasuo Ohno},
year = {2008},
doi = {10.1093/ietele/e91-c.7.1004},
url = {http://dx.doi.org/10.1093/ietele/e91-c.7.1004},
researchr = {https://researchr.org/publication/AoYOHO08},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-C},
number = {7},
pages = {1004-1008},
}