Yusuke Aoyama, Takeru Kuroiwa, Noriyuki Kushiro. Test Case Generation Algorithms and Tools for Specifications in Natural Language. In 2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{AoyamaKK20,
title = {Test Case Generation Algorithms and Tools for Specifications in Natural Language},
author = {Yusuke Aoyama and Takeru Kuroiwa and Noriyuki Kushiro},
year = {2020},
doi = {10.1109/ICCE46568.2020.9043022},
url = {https://doi.org/10.1109/ICCE46568.2020.9043022},
researchr = {https://researchr.org/publication/AoyamaKK20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Conference on Consumer Electronics (ICCE), Las Vegas, NV, USA, January 4-6, 2020},
publisher = {IEEE},
isbn = {978-1-7281-5186-1},
}