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Andrew Apicelli, Sam Bayless, Ankush Das, Andrew Gacek, Dhiva Jaganathan, Saswat Padhi, Vaibhav Sharma 0001, Michael W. Whalen, Raveesh Yadav. Automated Analyses of IOT Event Monitoring Systems. In Constantin Enea, Akash Lal, editors, Computer Aided Verification - 35th International Conference, CAV 2023, Paris, France, July 17-22, 2023, Proceedings, Part I. Volume 13964 of Lecture Notes in Computer Science, pages 27-39, Springer, 2023. [doi]

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