Davide Appello. Session Abstract. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 240-241, IEEE Computer Society, 2006. [doi]
@inproceedings{Appello06, title = {Session Abstract}, author = {Davide Appello}, year = {2006}, doi = {10.1109/VTS.2006.75}, url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.75}, researchr = {https://researchr.org/publication/Appello06}, cites = {0}, citedby = {0}, pages = {240-241}, booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2514-8}, }