Davide Appello. Automotive IC's: less testing, more prevention. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-2, IEEE, 2007. [doi]
@inproceedings{Appello07,
title = {Automotive IC's: less testing, more prevention},
author = {Davide Appello},
year = {2007},
doi = {10.1109/TEST.2007.4437699},
url = {http://dx.doi.org/10.1109/TEST.2007.4437699},
researchr = {https://researchr.org/publication/Appello07},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007},
editor = {Jill Sibert and Janusz Rajski},
publisher = {IEEE},
isbn = {1-4244-1128-9},
}