An approach for bug localization in models using two levels: model and metamodel

Lorena Arcega, Jaime Font, Øystein Haugen, Carlos Cetina. An approach for bug localization in models using two levels: model and metamodel. Software and Systems Modeling, 18(6):3551-3576, 2019. [doi]

Authors

Lorena Arcega

This author has not been identified. Look up 'Lorena Arcega' in Google

Jaime Font

This author has not been identified. Look up 'Jaime Font' in Google

Øystein Haugen

This author has not been identified. Look up 'Øystein Haugen' in Google

Carlos Cetina

This author has not been identified. Look up 'Carlos Cetina' in Google