Area Reliability Trade-Off in Improved Reed Muller Coding

Costas Argyrides, Stephania Loizidou, Dhiraj K. Pradhan. Area Reliability Trade-Off in Improved Reed Muller Coding. In Mladen Berekovic, Nikitas J. Dimopoulos, Stephan Wong, editors, Embedded Computer Systems: Architectures, Modeling, and Simulation, 8th International Workshop, SAMOS 2008, Samos, Greece, July 21-24, 2008. Proceedings. Volume 5114 of Lecture Notes in Computer Science, pages 116-125, Springer, 2008. [doi]

@inproceedings{ArgyridesLP08,
  title = {Area Reliability Trade-Off in Improved Reed Muller Coding},
  author = {Costas Argyrides and Stephania Loizidou and Dhiraj K. Pradhan},
  year = {2008},
  doi = {10.1007/978-3-540-70550-5_13},
  url = {http://dx.doi.org/10.1007/978-3-540-70550-5_13},
  tags = {reliability},
  researchr = {https://researchr.org/publication/ArgyridesLP08},
  cites = {0},
  citedby = {0},
  pages = {116-125},
  booktitle = {Embedded Computer Systems: Architectures, Modeling, and Simulation, 8th International Workshop, SAMOS 2008, Samos, Greece, July 21-24, 2008. Proceedings},
  editor = {Mladen Berekovic and Nikitas J. Dimopoulos and Stephan Wong},
  volume = {5114},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-540-70549-9},
}