S. Arias-Guzman, O. A. Ruiz-Guzman, L. F. Garcia-Arias, M. Jaramillo-Gonzales, P. D. Cardona-Orozco, A. J. Ustariz-Farfan, E. A. Cano-Plata, A. F. Salazar-Jimenez. Analysis of voltage sag severity case study in an industrial circuit. In 2015 IEEE Industry Applications Society Annual Meeting, Addison, TX, USA, October 18-22, 2015. pages 1-6, IEEE, 2015. [doi]
@inproceedings{Arias-GuzmanRGJ15,
title = {Analysis of voltage sag severity case study in an industrial circuit},
author = {S. Arias-Guzman and O. A. Ruiz-Guzman and L. F. Garcia-Arias and M. Jaramillo-Gonzales and P. D. Cardona-Orozco and A. J. Ustariz-Farfan and E. A. Cano-Plata and A. F. Salazar-Jimenez},
year = {2015},
doi = {10.1109/IAS.2015.7356932},
url = {http://dx.doi.org/10.1109/IAS.2015.7356932},
researchr = {https://researchr.org/publication/Arias-GuzmanRGJ15},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2015 IEEE Industry Applications Society Annual Meeting, Addison, TX, USA, October 18-22, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8394-0},
}