Kota Arieda, Takahiro Okabe. Illumination Planning for Measuring Per-Pixel Surface Roughness. In 17th International Conference on Machine Vision and Applications, MVA 2021, Aichi, Japan, July 25-27, 2021. pages 1-5, IEEE, 2021. [doi]
@inproceedings{AriedaO21, title = {Illumination Planning for Measuring Per-Pixel Surface Roughness}, author = {Kota Arieda and Takahiro Okabe}, year = {2021}, doi = {10.23919/MVA51890.2021.9511392}, url = {https://doi.org/10.23919/MVA51890.2021.9511392}, researchr = {https://researchr.org/publication/AriedaO21}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {17th International Conference on Machine Vision and Applications, MVA 2021, Aichi, Japan, July 25-27, 2021}, publisher = {IEEE}, isbn = {978-4-901122-20-7}, }