K. Arnold. Adaptive test delivers wide range of sophisticated test solutions. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 125, IEEE Computer Society, 2010. [doi]
@inproceedings{Arnold10-0,
title = {Adaptive test delivers wide range of sophisticated test solutions},
author = {K. Arnold},
year = {2010},
doi = {10.1109/VTS.2010.5469598},
url = {http://dx.doi.org/10.1109/VTS.2010.5469598},
tags = {testing},
researchr = {https://researchr.org/publication/Arnold10-0},
cites = {0},
citedby = {0},
pages = {125},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}