Randomized polynomial time identity testing for noncommutative circuits

Vikraman Arvind, Pushkar S. Joglekar, Partha Mukhopadhyay, S. Raja. Randomized polynomial time identity testing for noncommutative circuits. In Hamed Hatami, Pierre McKenzie, Valerie King, editors, Proceedings of the 49th Annual ACM SIGACT Symposium on Theory of Computing, STOC 2017, Montreal, QC, Canada, June 19-23, 2017. pages 831-841, ACM, 2017. [doi]

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