BIST-oriented test pattern generator for detection of transition faults

Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara. BIST-oriented test pattern generator for detection of transition faults. Systems and Computers in Japan, 34(3):76-84, 2003. [doi]

Authors

Takeshi Asakawa

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Kazuhiko Iwasaki

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Seiji Kajihara

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