Reliability Analysis of TSN Networks Under SEU Induced Soft Error Using Model Checking

Ayman A. Atallah, Ghaith Bany Hamad, Otmane Aït Mohamed. Reliability Analysis of TSN Networks Under SEU Induced Soft Error Using Model Checking. In IEEE Latin American Test Symposium, LATS 2019, Santiago, Chile, March 11-13, 2019. pages 1-6, IEEE, 2019. [doi]

Authors

Ayman A. Atallah

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Ghaith Bany Hamad

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Otmane Aït Mohamed

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