(Un)fair Exposure in Deep Face Rankings at a Distance

Andrea Atzori, Gianni Fenu, Mirko Marras. (Un)fair Exposure in Deep Face Rankings at a Distance. In IEEE International Joint Conference on Biometrics, IJCB 2023, Ljubljana, Slovenia, September 25-28, 2023. pages 1-9, IEEE, 2023. [doi]

Authors

Andrea Atzori

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Gianni Fenu

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Mirko Marras

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