Brian Aufderheide, B. Wayne Bequette. A variably tuned multiple model predictive controller based on minimal process knowledge. In American Control Conference, ACC 2001, Arlington, VA, USA, 25-27 June, 2001. pages 3490-3495, IEEE, 2001. [doi]
@inproceedings{AufderheideB01,
title = {A variably tuned multiple model predictive controller based on minimal process knowledge},
author = {Brian Aufderheide and B. Wayne Bequette},
year = {2001},
doi = {10.1109/ACC.2001.946173},
url = {https://doi.org/10.1109/ACC.2001.946173},
researchr = {https://researchr.org/publication/AufderheideB01},
cites = {0},
citedby = {0},
pages = {3490-3495},
booktitle = {American Control Conference, ACC 2001, Arlington, VA, USA, 25-27 June, 2001},
publisher = {IEEE},
isbn = {0-7803-6495-3},
}