Snorre Aunet. On the reliability of ultra low voltage circuits built from minority-3 gates. In 20th European Conference on Circuit Theory and Design, ECCTD 2011, Linkoping, Sweden, Aug. 29-31, 2011. pages 540-543, IEEE, 2011. [doi]
@inproceedings{Aunet11,
title = {On the reliability of ultra low voltage circuits built from minority-3 gates},
author = {Snorre Aunet},
year = {2011},
doi = {10.1109/ECCTD.2011.6043590},
url = {http://dx.doi.org/10.1109/ECCTD.2011.6043590},
researchr = {https://researchr.org/publication/Aunet11},
cites = {0},
citedby = {0},
pages = {540-543},
booktitle = {20th European Conference on Circuit Theory and Design, ECCTD 2011, Linkoping, Sweden, Aug. 29-31, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0617-2},
}