Relating the Evolution of Design Patterns and Crosscutting Concerns

Lerina Aversano, Luigi Cerulo, Massimiliano Di Penta. Relating the Evolution of Design Patterns and Crosscutting Concerns. In Seventh IEEE International Workshop on Source Code Analysis and Manipulation (SCAM 2007), September 30 - October 1, 2007, Paris, France. pages 180-192, IEEE, 2007. [doi]

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