Sequencing counts: A combined approach for sequencing and selecting costly unreliable off-line inspections

Tal Avinadav, David Sarne. Sequencing counts: A combined approach for sequencing and selecting costly unreliable off-line inspections. Computers & OR, 39(11):2488-2499, 2012. [doi]

@article{AvinadavS12,
  title = {Sequencing counts: A combined approach for sequencing and selecting costly unreliable off-line inspections},
  author = {Tal Avinadav and David Sarne},
  year = {2012},
  doi = {10.1016/j.cor.2011.12.018},
  url = {http://dx.doi.org/10.1016/j.cor.2011.12.018},
  researchr = {https://researchr.org/publication/AvinadavS12},
  cites = {0},
  citedby = {0},
  journal = {Computers & OR},
  volume = {39},
  number = {11},
  pages = {2488-2499},
}