Tolga Ayav. Fourier analysis-based automatic test pattern generation for combinational circuits. In 2015 23nd Signal Processing and Communications Applications Conference (SIU), Malatya, Turkey, May 16-19, 2015. pages 128-131, IEEE, 2015. [doi]
@inproceedings{Ayav15-0,
title = {Fourier analysis-based automatic test pattern generation for combinational circuits},
author = {Tolga Ayav},
year = {2015},
doi = {10.1109/SIU.2015.7129939},
url = {https://doi.org/10.1109/SIU.2015.7129939},
researchr = {https://researchr.org/publication/Ayav15-0},
cites = {0},
citedby = {0},
pages = {128-131},
booktitle = {2015 23nd Signal Processing and Communications Applications Conference (SIU), Malatya, Turkey, May 16-19, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7386-9},
}