Abdulbaki Aydin, Muath Alkhalaf, Tevfik Bultan. Automated Test Generation from Vulnerability Signatures. In IEEE Seventh International Conference on Software Testing, Verification and Validation, ICST 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, USA. pages 193-202, IEEE, 2014. [doi]
@inproceedings{AydinAB14-0, title = {Automated Test Generation from Vulnerability Signatures}, author = {Abdulbaki Aydin and Muath Alkhalaf and Tevfik Bultan}, year = {2014}, doi = {10.1109/ICST.2014.32}, url = {http://dx.doi.org/10.1109/ICST.2014.32}, researchr = {https://researchr.org/publication/AydinAB14-0}, cites = {0}, citedby = {0}, pages = {193-202}, booktitle = {IEEE Seventh International Conference on Software Testing, Verification and Validation, ICST 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, USA}, publisher = {IEEE}, isbn = {978-0-7695-5185-2}, }