James H. Aylor, Barry W. Johnson, Bruce J. Rector. Structured Design for Testability in Semicustom VLSI. IEEE Micro, 6(1):51-58, 1986. [doi]
@article{AylorJR86,
title = {Structured Design for Testability in Semicustom VLSI},
author = {James H. Aylor and Barry W. Johnson and Bruce J. Rector},
year = {1986},
doi = {10.1109/MM.1986.304637},
url = {http://doi.ieeecomputersociety.org/10.1109/MM.1986.304637},
researchr = {https://researchr.org/publication/AylorJR86},
cites = {0},
citedby = {0},
journal = {IEEE Micro},
volume = {6},
number = {1},
pages = {51-58},
}