Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales

N. Baboux, C. Plossu, P. Boivin. Dynamic Fowler-Nordheim injection in EEPROM tunnel oxides at realistic time scales. Microelectronics Reliability, 45(5-6):911-914, 2005. [doi]

Authors

N. Baboux

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C. Plossu

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P. Boivin

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