Thomas Bach, Artur Andrzejak, Ralf Pannemans, David Lo. The Impact of Coverage on Bug Density in a Large Industrial Software Project. In 2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2017, Toronto, ON, Canada, November 9-10, 2017. pages 307-313, IEEE, 2017. [doi]
@inproceedings{BachAPL17,
title = {The Impact of Coverage on Bug Density in a Large Industrial Software Project},
author = {Thomas Bach and Artur Andrzejak and Ralf Pannemans and David Lo},
year = {2017},
doi = {10.1109/ESEM.2017.44},
url = {https://doi.org/10.1109/ESEM.2017.44},
researchr = {https://researchr.org/publication/BachAPL17},
cites = {0},
citedby = {0},
pages = {307-313},
booktitle = {2017 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement, ESEM 2017, Toronto, ON, Canada, November 9-10, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4039-1},
}