Thermal regulator for IC temperature characterization using a microprobe station

Davide Baderna, Alessandro Cabrini, Guido Torelli. Thermal regulator for IC temperature characterization using a microprobe station. IEEE T. Instrumentation and Measurement, 55(3):754-760, 2006. [doi]

@article{BadernaCT06,
  title = {Thermal regulator for IC temperature characterization using a microprobe station},
  author = {Davide Baderna and Alessandro Cabrini and Guido Torelli},
  year = {2006},
  doi = {10.1109/TIM.2006.870102},
  url = {http://dx.doi.org/10.1109/TIM.2006.870102},
  researchr = {https://researchr.org/publication/BadernaCT06},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {55},
  number = {3},
  pages = {754-760},
}