Ameet Bagwe, Rubin A. Parekhji. Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 260, IEEE Computer Society, 2000. [doi]
@inproceedings{BagweP00, title = {Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems}, author = {Ameet Bagwe and Rubin A. Parekhji}, year = {2000}, url = {http://csdl.computer.org/comp/proceedings/ats/2000/0887/00/08870260abs.htm}, tags = {rule-based, test coverage, testing, analysis, coverage}, researchr = {https://researchr.org/publication/BagweP00}, cites = {0}, citedby = {0}, pages = {260}, booktitle = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan}, publisher = {IEEE Computer Society}, isbn = {0-7695-0887-1}, }