Variability analysis of resistive ternary content addressable memories

Mohamed A. Bahloul, Mohammed E. Fouda, Imen Barraj, Mohamed Masmoudi. Variability analysis of resistive ternary content addressable memories. I. J. Circuit Theory and Applications, 49(2):453-475, 2021. [doi]

@article{BahloulFBM21,
  title = {Variability analysis of resistive ternary content addressable memories},
  author = {Mohamed A. Bahloul and Mohammed E. Fouda and Imen Barraj and Mohamed Masmoudi},
  year = {2021},
  doi = {10.1002/cta.2919},
  url = {https://doi.org/10.1002/cta.2919},
  researchr = {https://researchr.org/publication/BahloulFBM21},
  cites = {0},
  citedby = {0},
  journal = {I. J. Circuit Theory and Applications},
  volume = {49},
  number = {2},
  pages = {453-475},
}