An OEE Improvement Method Based on TOC

Z. Q. Bai, M. Dai, Q. Y. Wei, Z. S. Zhang. An OEE Improvement Method Based on TOC. In 25th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2018, Stuttgart, Germany, November 20-22, 2018. pages 1-6, IEEE, 2018. [doi]

@inproceedings{BaiDWZ18,
  title = {An OEE Improvement Method Based on TOC},
  author = {Z. Q. Bai and M. Dai and Q. Y. Wei and Z. S. Zhang},
  year = {2018},
  doi = {10.1109/M2VIP.2018.8600875},
  url = {https://doi.org/10.1109/M2VIP.2018.8600875},
  researchr = {https://researchr.org/publication/BaiDWZ18},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {25th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2018, Stuttgart, Germany, November 20-22, 2018},
  publisher = {IEEE},
  isbn = {978-1-5386-7544-1},
}