AUNet: Learning Relations Between Action Units for Face Forgery Detection

Weiming Bai, Yufan Liu, Zhipeng Zhang, Bing Li, Weiming Hu. AUNet: Learning Relations Between Action Units for Face Forgery Detection. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 24709-24719, IEEE, 2023. [doi]

Authors

Weiming Bai

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Yufan Liu

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Zhipeng Zhang

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Bing Li

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Weiming Hu

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