Xu Bai, Ryusuke Nebashi, Makoto Miyamura, Kazunori Funahashi, Naoki Banno, Koichiro Okamoto, Hideaki Numata, Noriyuki Iguchi, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada. 28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation. IEICE Trans. Electron., 105-C(10):627-630, October 2022. [doi]
@article{BaiNMFBONISST22,
title = {28nm Atom-Switch FPGA: Static Timing Analysis and Evaluation},
author = {Xu Bai and Ryusuke Nebashi and Makoto Miyamura and Kazunori Funahashi and Naoki Banno and Koichiro Okamoto and Hideaki Numata and Noriyuki Iguchi and Tadahiko Sugibayashi and Toshitsugu Sakamoto and Munehiro Tada},
year = {2022},
month = {October},
doi = {10.1587/transele.2021fus0005},
url = {https://doi.org/10.1587/transele.2021fus0005},
researchr = {https://researchr.org/publication/BaiNMFBONISST22},
cites = {0},
citedby = {0},
journal = {IEICE Trans. Electron.},
volume = {105-C},
number = {10},
pages = {627-630},
}