Stevo Bailey, John Wright, Nandish Mehta, Rachel Hochman, Robert Jarnot, Vladimir Milovanovic, Dan Werthimer, Borivoje Nikolic. A 28nm FDSOI 8192-point digital ASIC spectrometer from a Chisel generator. In 2018 IEEE Custom Integrated Circuits Conference, CICC 2018, San Diego, CA, USA, April 8-11, 2018. pages 1-4, IEEE, 2018. [doi]
@inproceedings{BaileyWMHJMWN18,
title = {A 28nm FDSOI 8192-point digital ASIC spectrometer from a Chisel generator},
author = {Stevo Bailey and John Wright and Nandish Mehta and Rachel Hochman and Robert Jarnot and Vladimir Milovanovic and Dan Werthimer and Borivoje Nikolic},
year = {2018},
doi = {10.1109/CICC.2018.8357062},
url = {https://doi.org/10.1109/CICC.2018.8357062},
researchr = {https://researchr.org/publication/BaileyWMHJMWN18},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2018 IEEE Custom Integrated Circuits Conference, CICC 2018, San Diego, CA, USA, April 8-11, 2018},
publisher = {IEEE},
isbn = {978-1-5386-2483-8},
}