Features for Read Reference Voltage Estimation in NAND Flash Memory

Daniel Nicolas Bailon, Sergo Shavgulidze, Jürgen Freudenberger. Features for Read Reference Voltage Estimation in NAND Flash Memory. In 13th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2023, Berlin, Germany, September 3-5, 2023. pages 88-93, IEEE, 2023. [doi]

Authors

Daniel Nicolas Bailon

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Sergo Shavgulidze

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Jürgen Freudenberger

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