Henry S. Baird. Document image defect models and their uses. In 2nd International Conference Document Analysis and Recognition, ICDAR '93, October 20-22, 1993, Tsukuba City, Japan. pages 62-67, IEEE, 1993. [doi]
@inproceedings{Baird93-0,
title = {Document image defect models and their uses},
author = {Henry S. Baird},
year = {1993},
doi = {10.1109/ICDAR.1993.395781},
url = {http://dx.doi.org/10.1109/ICDAR.1993.395781},
researchr = {https://researchr.org/publication/Baird93-0},
cites = {0},
citedby = {0},
pages = {62-67},
booktitle = {2nd International Conference Document Analysis and Recognition, ICDAR '93, October 20-22, 1993, Tsukuba City, Japan},
publisher = {IEEE},
isbn = {0-8186-4960-7},
}