Peter Bak, Christian Rohrdantz, Svenja Leifert, Christoph Granacher, Stefan Koch, Simon Butscher, Patrick Jungk, Daniel A. Keim. Integrative visual analytics for suspicious behavior detection. In Proceedings of the IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2009, Atlantic City, New Jersey, USA, 11-16 October 2009, part of VisWeek 2009. pages 253-254, IEEE, 2009. [doi]
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